Testing in BiCMOS and CMOS Circuits.
Sankaran M. MenonYashwant K. MalaiyaAnura P. JayasumanaPublished in: VLSI Design (1997)
Keyphrases
- mixed signal
- analog vlsi
- delay insensitive
- circuit design
- high speed
- vlsi circuits
- low power
- multi channel
- cmos technology
- low cost
- power consumption
- chip design
- logic synthesis
- low voltage
- test cases
- focal plane
- floating gate
- random access memory
- power dissipation
- power supply
- asynchronous circuits
- real time
- software testing
- parallel processing
- test data
- expert systems
- computer vision