Joe Swenton

Publication Activity (10 Years)

Years Active: 1999-2024
Publications (10 Years): 10

Top Topics

High Compression Ratio

Cmos Technology

Top Venues

Publications

Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. IEEE Des. Test 41 (2) (2024)
Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen
Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis. ETS (2021)
Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. J. Electron. Test. 37 (2) (2021)
Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. ETS (2020)
Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. ITC (2019)
Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens
Defect-Location Identification for Cell-Aware Test. LATS (2019)
Zhan Gao, Min-Chun Hu, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen
Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. ITC-Asia (2019)
Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula
Improving Diagnosis Resolution and Performance at High Compression Ratios. ITC (2018)
Sameer Chillarige, Anil Malik, Sharjinder Singh, Joe Swenton, Krishna Chakravadhanula
High throughput multiple device diagnosis system. ITC (2017)
Sameer Chillarige, S. Virdi, Anil Malik, Krishna Chakravadhanula, Vivek Chickermane, Joe Swenton, G. Vandling
A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures. NATW (2015)
Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther
A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. Asian Test Symposium (1999)