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Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.

Zhan GaoMin-Chun HuRogier BaertBilal ChehabJoe SwentonSantosh MalagiJos HuiskenKees GoossensErik Jan Marinissen
Published in: IEEE Des. Test (2024)
Keyphrases
  • nm technology
  • power dissipation
  • high speed
  • low cost
  • test data
  • pattern recognition
  • test cases
  • power consumption
  • built in self test
  • real time
  • neural network
  • medical images