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Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.
Zhan Gao
Min-Chun Hu
Rogier Baert
Bilal Chehab
Joe Swenton
Santosh Malagi
Jos Huisken
Kees Goossens
Erik Jan Marinissen
Published in:
IEEE Des. Test (2024)
Keyphrases
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nm technology
power dissipation
high speed
low cost
test data
pattern recognition
test cases
power consumption
built in self test
real time
neural network
medical images