A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor.
Xinghao ChenThomas J. SnethenJoe SwentonRon WaltherPublished in: Asian Test Symposium (1999)
Keyphrases
- synthetic data
- detection method
- experimental evaluation
- high accuracy
- optimization algorithm
- image processing
- high precision
- computational cost
- theoretical analysis
- similarity measure
- pairwise
- cost function
- clustering method
- fully automatic
- neural network
- error rate
- support vector machine svm
- model selection
- support vector machine
- dynamic programming
- preprocessing
- objective function
- training data