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Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics.
Rawad N. Al-Haddad
Rashad S. Oreifej
Ramtin Zand
Abdel Ejnioui
Ronald F. DeMara
Published in:
NATW (2015)
Keyphrases
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risk management
reconfigurable architecture
low cost
modal logic
hardware implementation
automated reasoning
floating gate
artificial intelligence
general purpose
belief revision
error analysis
error detection
digital circuits
fine grain