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Using Existing Reconfigurable Logic in 3D Die Stacks for Test.

Fanchen ZhangYi SunXi ShenKundan NepalJennifer DworakTheodore W. ManikasPing GuiR. Iris BaharAl CrouchJohn C. Potter
Published in: NATW (2016)
Keyphrases
  • low cost
  • logic programming
  • classical logic
  • test data
  • modal logic
  • general purpose
  • automated reasoning
  • defeasible logic
  • real time
  • information retrieval
  • expert systems
  • statistical significance