Al Crouch

Publication Activity (10 Years)

Years Active: 1995-2017
Publications (10 Years): 5

Top Topics

Defeasible Logic

Semiconductor Devices

Top Venues

Publications

Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels
Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. ITC (2017)
Al Crouch, Michael Laisne, Martin Keim
Generalizing Access to Instrumentation Embedded in a Semiconductor Device. Computer 50 (7) (2017)
Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch
Mitigating simple power analysis attacks on LSIB key logic. NATW (2017)
Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter
Using Existing Reconfigurable Logic in 3D Die Stacks for Test. NATW (2016)
Jennifer Dworak, Al Crouch
A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. VTS (2015)
Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter
Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. DATE (2014)
Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton
Don't forget to lock your SIB: Hiding instruments using P16871. ITC (2013)
Miron Abramovici, Al Crouch
We need more standards like IEEE 1500. IEEE Des. Test Comput. 26 (1) (2009)
Ken Posse, Al Crouch, Jeff Rearick
IEEE P1687 IJTAG a presentation of current technology. ITC (2009)
Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC (2006)
Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts
IJTAG (internal JTAG): a step toward a DFT standard. ITC (2005)
Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir
Very Low Cost Testers: Opportunities and Challenges. IEEE Des. Test Comput. 18 (5) (2001)
Al Crouch
The DFT Psychic Network. IEEE Des. Test Comput. 16 (1) (1999)
Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
Best Methods for At-Speed Testing? VTS (1998)
Al Crouch, Jeff Freeman
Designing and Verifying Embedded Microprocessors. IEEE Des. Test Comput. 14 (4) (1997)
Joe Circello, Greg Edgington, Dan McCarthy, James Gay, David Schimke, Steven Sullivan, Richard Duerden, Chris Hinds, Danny Marquette, Lal Sood, Al Crouch, Daniel Chow
The superscalar architecture of the MC68060. IEEE Micro 15 (2) (1995)