Peter C. Maxwell

Publication Activity (10 Years)

Years Active: 1974-2021
Publications (10 Years): 5

Top Topics

White Blood Cells

Pattern Generation

Arabidopsis Thaliana

Phase Contrast Microscopy

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (3) (2021)
Friedrich Hapke, Peter C. Maxwell
Total Critical Area Based Testing. ITC (2018)
Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh
Bridge over troubled waters: Critical area based pattern generation. ETS (2017)
Hans-Joachim Wunderlich, Peter C. Maxwell
ETS 2015 best paper. ETS (2016)
Peter C. Maxwell, Friedrich Hapke, Huaxing Tang
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS (2016)
Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell
Adaptive testing: Conquering process variations. ETS (2012)
Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell
Towards Variation-Aware Test Methods. ETS (2011)
Peter C. Maxwell
Adaptive Testing: Dealing with Process Variability. IEEE Des. Test Comput. 28 (6) (2011)
Peter C. Maxwell
Adaptive test directions. ETS (2010)
Peter C. Maxwell
Principles and results of some test cost reduction methods for ASICs. ITC (2007)
Peter C. Maxwell
Wafer Level Reliability Screens. ETS (2007)
Peter C. Maxwell
The Design, Implementation and Analysis of Test Experiments. ITC (2006)
Peter C. Maxwell
Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. IEEE Des. Test Comput. 20 (5) (2003)
Jaume Segura, Peter C. Maxwell
Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Des. Test Comput. 19 (5) (2002)
Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
Debating the Future of Burn-In. VTS (2002)
Peter C. Maxwell
The Heisenberg Uncertainty of Test. ITC (2002)
Peter C. Maxwell
Wafer/Package Test Mix for Optimal Defect Detection. ITC (2002)
Peter C. Maxwell, Jeff Rearick
Deception by design: fooling ourselves with gate-level models. ITC (2000)
Peter C. Maxwell, Ismed Hartanto, Lee Bentz
Comparing functional and structural tests. ITC (2000)
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
Current ratios: a self-scaling technique for production IDDQ testing. ITC (2000)
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
Current ratios: a self-scaling technique for production I_DDQ testing. ITC (1999)
Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
CMOS IC reliability indicators and burn-in economics. ITC (1998)
Peter C. Maxwell, Jeff Rearick
Estimation of defect-free IDDQ in submicron circuits using switch level simulation. ITC (1998)
Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
Best Methods for At-Speed Testing? VTS (1998)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC (1997)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS (1997)
Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown
and AC Scan: The War Against Unmodelled Defects. ITC (1996)
Peter C. Maxwell
Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14 (5) (1995)
Peter C. Maxwell
The use of IDDQ testing in low stuck-at coverage situations. VTS (1995)
Peter C. Maxwell
The Many Faces of Test Synthesis. ITC (1995)
Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman
The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC (1994)
Peter C. Maxwell
Quality impacts of non-uniform fault coverage. VTS (1994)
Peter C. Maxwell
Let's Grade ALL the Faults. ITC (1993)
Peter C. Maxwell, Robert C. Aitken
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC (1993)
Peter C. Maxwell, Robert C. Aitken
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Des. Test Comput. 10 (1) (1993)
Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
, Functional and Scan Tests: How Many Fault Coverages Do We Need? ITC (1992)
Peter C. Maxwell, Robert C. Aitken
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electron. Test. 3 (4) (1992)
Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC (1991)
Peter C. Maxwell
The Interaction of Test and Quality. ITC (1991)
Peter C. Maxwell, Hans-Joachim Wunderlich
The effectiveness of different test sets for PLAs. EURO-DAC (1990)
Peter C. Maxwell
Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. IEEE Trans. Computers 37 (11) (1988)
Philip G. McCrea, Peter C. Maxwell, P. W. Baker
Comments on "A Floating Point Multiplexed DDA System". IEEE Trans. Computers 27 (12) (1978)
Peter C. Maxwell
. IEEE Trans. Computers 26 (11) (1977)
Peter C. Maxwell, P. W. Baker, Philip G. McCrea
Incremental Computer Systems. Aust. Comput. J. 8 (3) (1976)
Peter C. Maxwell
Alternative Descriptions in Line Drawing Analysis. Artif. Intell. 5 (4) (1974)