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Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era.

Jaume SeguraPeter C. Maxwell
Published in: IEEE Des. Test Comput. (2002)
Keyphrases
  • virtual machine
  • data mining
  • test cases
  • special issue
  • big data
  • test generation
  • vlsi circuits
  • genetic algorithm
  • information systems
  • integrated circuit