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Test Sets and Reject Rates: All Fault Coverages are Not Created Equal.
Peter C. Maxwell
Robert C. Aitken
Published in:
IEEE Des. Test Comput. (1993)
Keyphrases
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test set
error rate
training set
fault detection
test data
training data
test cases
fault diagnosis
evaluation methodology
database
machine learning
expert systems
naive bayes
confidence intervals
multiple faults