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Test Sets and Reject Rates: All Fault Coverages are Not Created Equal.

Peter C. MaxwellRobert C. Aitken
Published in: IEEE Des. Test Comput. (1993)
Keyphrases
  • test set
  • error rate
  • training set
  • fault detection
  • test data
  • training data
  • test cases
  • fault diagnosis
  • evaluation methodology
  • database
  • machine learning
  • expert systems
  • naive bayes
  • confidence intervals
  • multiple faults