Pete O'Neill

Publication Activity (10 Years)

Years Active: 1999-2002
Publications (10 Years): 0

Publications

Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill
Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. ITC (2002)
Pete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg
Reliability Beyond GHz. VTS (2001)
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
Current ratios: a self-scaling technique for production IDDQ testing. ITC (2000)
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
Current ratios: a self-scaling technique for production I_DDQ testing. ITC (1999)