Login / Signup
Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation.
Minh Quach
Tuan Pham
Tim Figal
Bob Kopitzke
Pete O'Neill
Published in:
ITC (2002)
Keyphrases
</>
software development
test data
test cases
testing process
software testing
test set
training data
search based testing
training set
data sets
training samples
training and test data
supervised learning
statistical approaches
white box
integrated circuit
database systems