Mike Tripp

Publication Activity (10 Years)

Years Active: 2001-2009
Publications (10 Years): 0

Publications

Gadi Singer, Rajesh Galivanche, Srinivas Patil, Mike Tripp
The Challenges of Nanotechnology and Gigacomplexity. IEEE Des. Test Comput. 26 (1) (2009)
Mike Tripp, Silvio Picano, Baruch Schnarch
Drive only at speed functional testing; one of the techniques Intel is using to control test costs. ITC (2005)
Mike Tripp, T. M. Mak, Anne Meixner
Elimination of Traditional Functional Testing of Interface Timings at Intel. ITC (2004)
T. M. Mak, Mike Tripp, Anne Meixner
Testing Gbps Interfaces without a Gigahertz Tester. IEEE Des. Test Comput. 21 (4) (2004)
Mike Tripp, T. M. Mak, Anne Meixner
Design considerations and DFT to enable testing of digital interfaces. CICC (2004)
Mike Tripp
ITC 2004 Panel: Cost of Test - Taking Control. ITC (2004)
Mike Tripp, T. M. Mak, Anne Meixner
Elimination of Traditional Functional Testing of Interface Timings at Intel. ITC (2003)
Mike Tripp
On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms). ITC (2002)
Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp
Realizing the Benefits of Structural Test for Intel Microprocessors. ITC (2002)
Pete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg
Reliability Beyond GHz. VTS (2001)