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On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms).

Mike Tripp
Published in: ITC (2002)
Keyphrases
  • lower cost
  • low cost
  • frequency domain
  • benchmark problems
  • optimal solution
  • user interface
  • high speed
  • manufacturing systems
  • real time
  • decision making
  • solution space