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Defect-Oriented Test: Effectiveness in High Volume Manufacturing.

Friedrich HapkeWill HowellPeter C. MaxwellEdward BrazilSrikanth VenkataramanRudrajit DuttaAndreas GlowatzAnja FastJanusz Rajski
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)
Keyphrases
  • high volume
  • real time
  • machine learning
  • data warehouse
  • test cases
  • big data
  • manufacturing systems
  • data analysis
  • response time
  • production planning