Anja Fast

Publication Activity (10 Years)

Years Active: 2014-2021
Publications (10 Years): 2

Top Topics

Automotive Industry

Microscope Images

Mutation Testing

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (3) (2021)
Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC (2018)
Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (9) (2014)
Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski
Cell-aware experiences in a high-quality automotive test suite. ETS (2014)