Friedrich Hapke

Publication Activity (10 Years)

Years Active: 2003-2021
Publications (10 Years): 6

Top Topics

Arabidopsis Thaliana

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (3) (2021)
Friedrich Hapke, Peter C. Maxwell
Total Critical Area Based Testing. ITC (2018)
Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC (2018)
Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh
Bridge over troubled waters: Critical area based pattern generation. ETS (2017)
Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test 33 (6) (2016)
Peter C. Maxwell, Friedrich Hapke, Huaxing Tang
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS (2016)
Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT (2015)
Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Embedded deterministic test points for compact cell-aware tests. ITC (2015)
Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (9) (2014)
Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS (2014)
Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski
Cell-aware experiences in a high-quality automotive test suite. ETS (2014)
Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
Industrial Application of IEEE P1687 for an Automotive Product. DSD (2013)
Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke
Fault collapsing of multi-conditional faults. DDECS (2013)
Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski
Cell-aware Production test results from a 32-nm notebook processor. ITC (2012)
Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
A new SAT-based ATPG for generating highly compacted test sets. DDECS (2012)
Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD (2012)
Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl
EDA solutions to new-defect detection in advanced process technologies. DATE (2012)
Friedrich Hapke, Jürgen Schlöffel
Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. ETS (2012)
Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers
Cell-aware analysis for small-delay effects and production test results from different fault models. ITC (2011)
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
Defect-oriented cell-internal testing. ITC (2010)
Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. 26 (3) (2010)
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC (2009)
Marc Messing, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
Using a two-dimensional fault list for compact Automatic Test Pattern Generation. LATW (2009)
Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz
Restrict Encoding for Mixed-Mode BIST. VTS (2009)
Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille
On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (7) (2008)
Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL (2007)
Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE (2007)
Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC (2007)
Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef
Programmable deterministic Built-In Self-Test. ITC (2007)
Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke
Fault detection and diagnosis with parity trees for space compaction of test responses. DAC (2006)
Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke
X-masking during logic BIST and its impact on defect coverage. IEEE Trans. Very Large Scale Integr. Syst. 14 (2) (2006)
Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI (2005)
Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker
X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC (2004)
Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers
Efficient Pattern Mapping for Deterministic Logic BIST. ITC (2004)
Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC (2003)