Elham K. Moghaddam

Publication Activity (10 Years)

Years Active: 2007-2021
Publications (10 Years): 9

Top Topics

Statistical Significance

Driver Assistance

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Time and Area Optimized Testing of Automotive ICs. IEEE Trans. Very Large Scale Integr. Syst. 29 (1) (2021)
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
Logic BIST With Capture-Per-Clock Hybrid Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (6) (2019)
Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki
Test Time and Area Optimized BrST Scheme for Automotive ICs. ITC (2019)
Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Hardware Protection via Logic Locking Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (12) (2018)
Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada
Embedded Deterministic Test Points. IEEE Trans. Very Large Scale Integr. Syst. 25 (10) (2017)
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Test point insertion in hybrid test compression/LBIST architectures. ITC (2016)
Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test 33 (6) (2016)
Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer
Minimal area test points for deterministic patterns. ITC (2016)
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
On Test Points Enhancing Hardware Security. ATS (2016)
Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada
Design for low test pattern counts. DAC (2015)
Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Embedded deterministic test points for compact cell-aware tests. ITC (2015)
Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang
Isometric Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (11) (2015)
Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang
Isometric test compression with low toggling activity. ITC (2014)
Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer
Power Aware Embedded Test. Asian Test Symposium (2011)
Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy
Low power compression utilizing clock-gating. ITC (2011)
Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki
Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. Asian Test Symposium (2011)
Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab
Low capture power at-speed test in EDT environment. ITC (2010)
Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab
At-speed scan test with low switching activity. VTS (2010)
Elham K. Moghaddam, Shaahin Hessabi
An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits. DSD (2007)
Elham K. Moghaddam, Shaahin Hessabi
An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits. ATS (2007)