Login / Signup

Test Time and Area Optimized BrST Scheme for Automotive ICs.

Nilanjan MukherjeeJerzy TyszerDaniel TilleMahendar SapatiYingdi LiuJeffrey MayerSylwester MilewskiElham K. MoghaddamJanusz RajskiJedrzej Solecki
Published in: ITC (2019)
Keyphrases
  • information retrieval
  • artificial neural networks
  • learning scheme
  • real world
  • information systems
  • image sequences
  • test cases
  • statistical tests
  • classification scheme
  • detection scheme