Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.
Elham K. MoghaddamJanusz RajskiSudhakar M. ReddyJakub JanickiPublished in: Asian Test Symposium (2011)
Keyphrases
- test data
- power dissipation
- low power
- power consumption
- high speed
- low power consumption
- test cases
- low cost
- power reduction
- training data
- test set
- logic circuits
- cmos technology
- data sets
- digital signal processing
- training set
- energy efficiency
- power saving
- relational databases
- database systems
- supervised learning
- computational power
- energy saving
- training and test data
- low voltage
- image processing
- real time
- mixed signal