An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits.
Elham K. MoghaddamShaahin HessabiPublished in: DSD (2007)
Keyphrases
- fault detection
- analog vlsi
- delay insensitive
- circuit design
- high speed
- fault diagnosis
- vlsi circuits
- built in self test
- industrial processes
- fault identification
- focal plane
- condition monitoring
- random access memory
- low cost
- floating gate
- fault localization
- cmos technology
- tennessee eastman
- power dissipation
- failure detection
- chip design
- power consumption
- robust fault detection
- fault isolation
- fuel cell
- asynchronous circuits
- low voltage
- fault detection and diagnosis
- infrared
- gas turbine
- machine learning
- data mining
- low power
- fuzzy sets
- association rules