Time and Area Optimized Testing of Automotive ICs.
Nilanjan MukherjeeDaniel TilleMahendar SapatiYingdi LiuJeffrey MayerSylwester MilewskiElham K. MoghaddamJanusz RajskiJedrzej SoleckiJerzy TyszerPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2021)