Justyna Zawada

Publication Activity (10 Years)

Years Active: 2014-2022
Publications (10 Years): 11

Top Topics

Metadata Creation

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski
Efficient Test Compression Configuration Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin
Test Challenges of Intel IA Cores. ITC (2020)
Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. ITC (2020)
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
Logic BIST With Capture-Per-Clock Hybrid Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (6) (2019)
Janusz Rajski, Jerzy Tyszer, Justyna Zawada
On New Class of Test Points and Their Applications. ITC (2018)
Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Hardware Protection via Logic Locking Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (12) (2018)
Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
Full-scan LBIST with capture-per-cycle hybrid test points. ITC (2017)
Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada
Embedded Deterministic Test Points. IEEE Trans. Very Large Scale Integr. Syst. 25 (10) (2017)
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Test point insertion in hybrid test compression/LBIST architectures. ITC (2016)
Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test 33 (6) (2016)
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
On Test Points Enhancing Hardware Security. ATS (2016)
Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada
Design for low test pattern counts. DAC (2015)
Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
Embedded deterministic test points for compact cell-aware tests. ITC (2015)
Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada
Quality assurance in memory built-in self-test tools. DDECS (2014)