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Embedded Deterministic Test Points.

Cesar AceroDerek FelthamYingdi LiuElham K. MoghaddamNilanjan MukherjeeMarek PatyraJanusz RajskiSudhakar M. ReddyJerzy TyszerJustyna Zawada
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2017)
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