Efficient Test Compression Configuration Selection.
Chong-Siao YeShi-Xuan ZhengFong-Jyun TsaiChen WangKuen-Jong LeeWu-Tung ChengSudhakar M. ReddyJustyna ZawadaMark KassabJanusz RajskiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)