Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.
Fong-Jyun TsaiChong-Siao YeKuen-Jong LeeShi-Xuan ZhengYu HuangWu-Tung ChengSudhakar M. ReddyMark KassabJanusz RajskiChen WangJustyna ZawadaPublished in: ITC (2020)