Artur Pogiel

Publication Activity (10 Years)

Years Active: 2004-2022
Publications (10 Years): 3

Top Topics

Scripting Languages

Electrical Power Systems

Quality Assurance

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer
LBIST for Automotive ICs With Enhanced Test Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
Convolutional Compaction-Based MRAM Fault Diagnosis. ETS (2021)
Artur Pogiel, Janusz Rajski, Jerzy Tyszer
) test algorithms. ETS (2017)
Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada
Quality assurance in memory built-in self-test tools. DDECS (2014)
Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer
High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. ATS (2014)
Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer
Ring Generator: An Ultimate Linear Feedback Shift Register. Computer 44 (6) (2011)
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
BIST-Based Fault Diagnosis for Read-Only Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (7) (2011)
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. ETS (2011)
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electron. Test. 27 (5) (2011)
Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek
Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium (2011)
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Diagnosis of failing scan cells through orthogonal response compaction. ETS (2010)
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (3) (2010)
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
Fault diagnosis for embedded read-only memories. ITC (2009)
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
High-Speed On-Chip Event Counters for Embedded Systems. VLSI Design (2009)
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. ITC (2008)
Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer
Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electron. Test. 23 (1) (2007)
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
Fault Diagnosis With Convolutional Compactors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (8) (2007)
Artur Pogiel, Janusz Rajski, Jerzy Tyszer
Convolutional Compactors with Variable Polynomials. ETS (2006)
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
Diagnosis with convolutional compactors in presence of unknown states. ITC (2005)
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang
Convolutional compaction-driven diagnosis of scan failures. ETS (2005)
Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski
Fault Diagnosis in Designs with Convolutional Compactors. ITC (2004)