High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST.

Nilanjan Mukherjee Artur Pogiel Janusz Rajski Jerzy Tyszer

Published in: ITC (2008)

Keyphrases

high throughput
data sets
data acquisition
database
data analysis
data sources
knowledge discovery
high dimensional data
microarray
data mining
data collection
sensor networks
low cost
systems biology
genomic data