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Isolation of Failing Scan Cells through Convolutional Test Response Compaction.
Grzegorz Mrugalski
Janusz Rajski
Chen Wang
Artur Pogiel
Jerzy Tyszer
Published in:
J. Electron. Test. (2007)
Keyphrases
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test data
neural network
machine learning
deep learning
database
feature selection
case study
image segmentation
higher order
test cases
scan data