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High Volume Diagnosis in Memory BIST Based on Compressed Failure Data.
Nilanjan Mukherjee
Artur Pogiel
Janusz Rajski
Jerzy Tyszer
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
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high volume
data structure
data sets
data sources
big data
raw data
component failures
training data
machine learning
xml documents
end users
data points
knowledge discovery
software engineering
data analysis
original data
credit card
real time