At-speed scan test with low switching activity.

Elham K. Moghaddam Janusz Rajski Sudhakar M. Reddy Mark Kassab

Published in: VTS (2010)

Keyphrases

high speed
data mining
human activities
processing speed
information systems
binary images
test cases
low memory requirements
real time
high levels
test data
human computer interaction
collaborative learning
three dimensional
computer vision
search engine
genetic algorithm