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Diagnosing timing related cell internal defects for FinFET technology.

Huaxing TangTing-Pu TaiWu-Tung ChengBrady BenwareFriedrich Hapke
Published in: VLSI-DAT (2015)
Keyphrases
  • case study
  • cost effective
  • rapid development
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  • data processing
  • genetic algorithm
  • metadata
  • computer systems
  • personal computer
  • st century
  • internal and external