Ting-Pu Tai

Publication Activity (10 Years)

Years Active: 2007-2022
Publications (10 Years): 4

Top Topics

Cf Loadingtexthtml

Medical Diagnostic

Image Stitching

Energy Dissipation

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Khader S. Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai
Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs. ITC (2022)
Steve Pateras, Ting-Pu Tai
Automotive semiconductor test. VLSI-DAT (2017)
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan
Diagnosis and Layout Aware (DLA) Scan Chain Stitching. IEEE Trans. Very Large Scale Integr. Syst. 23 (3) (2015)
Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT (2015)
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan
Diagnosis and Layout Aware (DLA) scan chain stitching. ITC (2013)
Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen
Case study of scan chain diagnosis and PFA on a low yield wafer. ITC (2010)
Kun-Han Tsai, Yu Huang, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli
Test cycle power optimization for scan-based designs. ITC (2010)
Shomo Chen, Ning Huang, Ting-Pu Tai, Actel Niu
Customized Algorithms for High Performance Memory Test in Advanced Technology Node. Asian Test Symposium (2009)
Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen
Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. Asian Test Symposium (2009)
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC (2008)
Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann
Faster defect localization in nanometer technology based on defective cell diagnosis. ITC (2007)