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Faster defect localization in nanometer technology based on defective cell diagnosis.
Manish Sharma
Wu-Tung Cheng
Ting-Pu Tai
Y. S. Cheng
Will Hsu
Chen Liu
Sudhakar M. Reddy
Albert Mann
Published in:
ITC (2007)
Keyphrases
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rapid development
case study
cost effective
key technologies
st century
computer systems
localization error
multiple faults