Liyang Lai

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 6

Top Topics

Attention Deficit Hyperactivity Disorder

Diagnostic Process

Heterogeneous Computing

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Xiaoze Lin, Liyang Lai, Huawei Li
Parallel Static Learning Toward Heterogeneous Computing Architectures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (3) (2024)
Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang
GPU-Based Concurrent Static Learning. ITC (2023)
Jingbo Hu, Guohao Dai, Liuzheng Wang, Liyang Lai, Yu Huang, Huazhong Yang, Yu Wang
Adaptive Multidimensional Parallel Fault Simulation Framework on Heterogeneous System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (6) (2023)
Xiaoze Lin, Liyang Lai, Huawei Li
Scalable Parallel Static Learning. ITC-Asia (2021)
Liyang Lai, Qiting Zhang, Kun-Han Hans Tsai, Wu-Tung Cheng
GPU-based Hybrid Parallel Logic Simulation for Scan Patterns. ITC-Asia (2020)
Liyang Lai, Kun-Han Tsai, Huawei Li
GPGPU-Based ATPG System: Myth or Reality? IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (1) (2020)
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan
Diagnosis and Layout Aware (DLA) Scan Chain Stitching. IEEE Trans. Very Large Scale Integr. Syst. 23 (3) (2015)
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan
Diagnosis and Layout Aware (DLA) scan chain stitching. ITC (2013)
Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Song-lin Zuo, Liyang Lai, John Rowe, Thomas Zanon
STDF Memory Fail Datalog Standard. VTS (2009)
Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng
Detection and Diagnosis of Static Scan Cell Internal Defect. ITC (2008)
Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai
X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Des. Test Comput. 24 (5) (2007)
Liyang Lai, Wu-Tung Cheng, Thomas Rinderknecht
Programmable Scan-Based Logic Built-In Self Test. ATS (2007)
Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill
Signature Based Diagnosis for Logic BIST. ITC (2006)
Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
Hardware Ef.cient LBISTWith Complementary Weights. ICCD (2005)
Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel
Logic BIST Using Constrained Scan Cells. VTS (2004)
Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
Logic BIST with Scan Chain Segmentation. ITC (2004)