Programmable Scan-Based Logic Built-In Self Test.

Liyang Lai Wu-Tung Cheng Thomas Rinderknecht

Published in: ATS (2007)

Keyphrases

built in self test
integrated circuit
low cost
general purpose
scan data
data sets
data mining
computational properties
sound and complete axiomatization
query language
high speed
automated reasoning
multi valued
formal theory
epistemic logic