Logic BIST Using Constrained Scan Cells.
Liyang LaiThomas RinderknechtWu-Tung ChengJanak H. PatelPublished in: VTS (2004)
Keyphrases
- built in self test
- classical logic
- logic programming
- cellular automaton
- constrained problems
- neural network
- information retrieval
- scan data
- proof theory
- modal logic
- automated reasoning
- logical framework
- multi valued
- range scans
- deontic logic
- nonmonotonic logics
- set theory
- computational properties
- real time
- probability theory
- integrated circuit
- cellular automata
- multiscale
- case study
- data sets