Case study of scan chain diagnosis and PFA on a low yield wafer.
Yu HuangBrady BenwareWu-Tung ChengTing-Pu TaiFeng-Ming KuoYuan-Shih ChenPublished in: ITC (2010)
Keyphrases
- case study
- medical diagnosis
- automatic diagnosis
- real world
- breast cancer diagnosis
- model based diagnosis
- databases
- dynamic systems
- lessons learned
- real time
- software development
- knowledge management
- decision trees
- integrated circuit
- artificial intelligence
- fault detection
- cancer diagnosis
- diagnostic reasoning
- semiconductor manufacturing
- disease diagnosis
- genetic algorithm
- attention deficit hyperactivity disorder