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Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.

Manish SharmaBrady BenwareLei LingDavid AbercrombieLincoln LeeMartin KeimHuaxing TangWu-Tung ChengTing-Pu TaiYi-Jung ChangReinhart LinAlbert Mann
Published in: ITC (2008)
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