Tom Waayers

Publication Activity (10 Years)

Years Active: 2001-2013
Publications (10 Years): 0

Top Topics

Decision Makers

Industrial Applications

Intelligent Agent Technology

Driver Assistance

Top Venues

Publications

Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
Industrial Application of IEEE P1687 for an Automotive Product. DSD (2013)
Tom Waayers, Richard Morren, Xijiang Lin, Mark Kassab
Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains. ITC (2010)
Tom Waayers, Erik Jan Marinissen, Maurice Lousberg
IEEE Std 1500 Compliant Infrastructure forModular SOC Testing. Asian Test Symposium (2005)
Tom Waayers, Richard Morren, Roberto Grandi
Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain. ITC (2005)
Geert Seuren, Tom Waayers
Extending the Digital Core-based Test Methodology to Support Mixed-Signal. ITC (2004)
Erik Jan Marinissen, Tom Waayers
Infrastructure for modular SOC testing. CICC (2004)
Leon van de Logt, Frank van der Heyden, Tom Waayers
An extension to JTAG for at-speed debug on a system. ITC (2003)
Bart Vermeulen, Tom Waayers, Sjaak Bakker
Multi-TAP Controller Architecture for Digital System Chips. J. Electron. Test. 19 (4) (2003)
Tom Waayers
An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips. ITC (2003)
Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier
Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electron. Test. 18 (2) (2002)
Bart Vermeulen, Tom Waayers, Sjaak Bakker
EEE 1149.1-Compliant Access Architecture for Multiple Core Debug on Digital System Chips. ITC (2002)
Bart Vermeulen, Tom Waayers, Sandeep Kumar Goel
Core-Based Scan Architecture for Silicon Debug. ITC (2002)
Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier
Enhanced reduced pin-count test for full-scan design. ITC (2001)
Sandeep Koranne, Tom Waayers, Robert Beurze, Clemens Wouters, Sunil Kumar, G. S. Visweswara
A P1500 Compliant Programable BistShell for Embedded Memories. MTDT (2001)