David Lelouvier

Publication Activity (10 Years)

Years Active: 2001-2002
Publications (10 Years): 0

Publications

Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier
Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electron. Test. 18 (2) (2002)
Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier
Enhanced reduced pin-count test for full-scan design. ITC (2001)