Hérvé Fleury

Publication Activity (10 Years)

Years Active: 2000-2007
Publications (10 Years): 0

Publications

Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky
High throughput non-contact SiP testing. ITC (2007)
Hérvé Fleury
Electronic circuit comprising a secret sub-module. ITC (2004)
Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier
Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electron. Test. 18 (2) (2002)
Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier
Enhanced reduced pin-count test for full-scan design. ITC (2001)
Chouki Aktouf, Hérvé Fleury, Chantal Robach
Inserting Scan at the Behavioral Level. IEEE Des. Test Comput. 17 (3) (2000)