Enhanced Reduced Pin-Count Test for Full-Scan Design.

Harald P. E. Vranken Tom Waayers Hérvé Fleury David Lelouvier

Published in: J. Electron. Test. (2002)

Keyphrases

evolutionary algorithm
design process
user experience
design patterns
data sets
information retrieval
social networks
decision making
knowledge based systems
design principles
conceptual framework
design decisions
experimental design
design tools