X-Masking During Logic BIST and Its Impact on Defect Coverage.
Yuyi TangHans-Joachim WunderlichHarald P. E. VrankenFriedrich HapkeMichael WittkePiet EngelkeIlia PolianBernd BeckerPublished in: ITC (2004)
Keyphrases
- built in self test
- modal logic
- automated reasoning
- data mining
- multi valued
- proof theory
- human visual system
- decision trees
- logic programming
- feature extraction
- information systems
- neural network
- website
- factors that influence
- classical logic
- computational properties
- predicate logic
- high impact
- image sequences
- empirically derived