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X-masking during logic BIST and its impact on defect coverage.
Yuyi Tang
Hans-Joachim Wunderlich
Piet Engelke
Ilia Polian
Bernd Becker
Jürgen Schlöffel
Friedrich Hapke
Michael Wittke
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2006)
Keyphrases
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built in self test
image sequences
multi valued
logic programming
human visual system
modal logic
factors that influence
classical logic
digital circuits
high impact
databases
information retrieval
search algorithm
expert systems
computational properties
defect detection