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PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits.

Junhao ShiGörschwin FeyRolf DrechslerAndreas GlowatzFriedrich HapkeJürgen Schlöffel
Published in: ISVLSI (2005)
Keyphrases
  • data sets
  • computationally efficient
  • orders of magnitude
  • database
  • industrial applications