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Programmable deterministic Built-In Self-Test.

Abdul Wahid HakmiHans-Joachim WunderlichChristian G. ZoellinAndreas GlowatzFriedrich HapkeJürgen SchlöffelLaurent Souef
Published in: ITC (2007)
Keyphrases
  • built in self test
  • low cost
  • general purpose
  • genetic algorithm
  • integrated circuit
  • relaxation algorithm
  • database
  • data sets
  • computer vision
  • multi agent
  • search algorithm
  • pattern recognition