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Defect-oriented cell-internal testing.

Friedrich HapkeWilfried RedemundJürgen SchlöffelRene Krenz-BaathAndreas GlowatzMichael WittkeHamidreza HashempourStefan Eichenberger
Published in: ITC (2010)
Keyphrases
  • test cases
  • internal and external
  • feature selection
  • databases
  • data mining
  • image processing
  • learning environment
  • image analysis
  • test set
  • microscopic images
  • internal states