Wayne M. Needham

Publication Activity (10 Years)

Years Active: 1996-1999
Publications (10 Years): 0

Publications

Wayne M. Needham
Nanometer Technology Challenges for Test and Test Equipment. Computer 32 (11) (1999)
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC (1998)
Wayne M. Needham
Just how real is the SIA roadmap. ITC (1998)
Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
Best Methods for At-Speed Testing? VTS (1998)
Wayne M. Needham
Guest Editor's Introduction: Microprocessor Testing Today. IEEE Des. Test Comput. 15 (3) (1998)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC (1997)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS (1997)
Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther
Microprocessor Test and Validation: Any New Avenues? VTS (1997)
Wayne M. Needham, Naga Gollakota
DFT Strategy for Intel Microprocessors. ITC (1996)