Yeoh Eng Hong

Publication Activity (10 Years)

Years Active: 1997-1998
Publications (10 Years): 0

Publications

Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC (1998)
Yeoh Eng Hong, Martin Tay Tiong We
The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. ITC (1997)